Chen Guo 0002, Bowen Ling, Gary Mavko, Richard C. Liu. Effect of Microgeometry on Modeling Accuracy of Fluid-Saturated Rock Using Dielectric Permittivity. IEEE T. Geoscience and Remote Sensing, 57(9):7294-7299, 2019. [doi]
@article{GuoLML19,
title = {Effect of Microgeometry on Modeling Accuracy of Fluid-Saturated Rock Using Dielectric Permittivity},
author = {Chen Guo 0002 and Bowen Ling and Gary Mavko and Richard C. Liu},
year = {2019},
doi = {10.1109/TGRS.2019.2919925},
url = {https://doi.org/10.1109/TGRS.2019.2919925},
researchr = {https://researchr.org/publication/GuoLML19},
cites = {0},
citedby = {0},
journal = {IEEE T. Geoscience and Remote Sensing},
volume = {57},
number = {9},
pages = {7294-7299},
}