One-Sketch: A Unified Framework for Per-Flow Cardinality Measurement with Flexible Bias Control

Kejun Guo, Fuliang Li, Jiaxing Shen, Haorui Wan, Songlin Chen, Man Hou. One-Sketch: A Unified Framework for Per-Flow Cardinality Measurement with Flexible Bias Control. In IEEE INFOCOM 2026 - IEEE Conference on Computer Communications, Tokyo, Japan, May 18-21, 2026. pages 1-10, IEEE, 2026. [doi]

Abstract

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