Ruifeng Guo, Srikanth Venkataraman. An algorithmic technique for diagnosis of faulty scan chains. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(9):1861-1868, 2006. [doi]
@article{GuoV06:1,
title = {An algorithmic technique for diagnosis of faulty scan chains},
author = {Ruifeng Guo and Srikanth Venkataraman},
year = {2006},
doi = {10.1109/TCAD.2005.858267},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2005.858267},
researchr = {https://researchr.org/publication/GuoV06%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {9},
pages = {1861-1868},
}