Krishn Kumar Gupt, Meghana Kshirsagar 0002, Joseph P. Sullivan, Conor Ryan. Automatic Test Case Generation for Vulnerability Analysis of Galois Field Arithmetic Circuits. In 5th IEEE International Conference on Cryptography, Security and Privacy, CSP 2021, Zhuhai, China, January 8-10, 2021. pages 32-37, IEEE, 2021. [doi]
Abstract is missing.