Characterization of Fast, Accurate Leakage Power Models for IEEE P2416

Barkha Gupta, W. Rhett Davis. Characterization of Fast, Accurate Leakage Power Models for IEEE P2416. In 20th International Symposium on Quality Electronic Design, ISQED 2019, Santa Clara, CA, USA, March 6-7, 2019. pages 39-44, IEEE, 2019. [doi]

Authors

Barkha Gupta

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W. Rhett Davis

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