Rupal Gupta, Ganesh D. Prediction of Defective Artifacts by Removing Redundant Metrics in Software Development Life Cycle (SDLC). In 6th International Conference on Contemporary Computing and Informatics, IC3I 2023, Gautam Buddha Nagar, India, September 14-16, 2023. pages 1914-1917, IEEE, 2023. [doi]
Abstract is missing.