Probabilistic Error Propagation Modeling in Logic Circuits

Shekhar Gupta, Arjan J. C. van Gemund, Rui Abreu. Probabilistic Error Propagation Modeling in Logic Circuits. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 617-623, IEEE Computer Society, 2011. [doi]

Authors

Shekhar Gupta

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Arjan J. C. van Gemund

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Rui Abreu

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