Probabilistic Error Propagation Modeling in Logic Circuits

Shekhar Gupta, Arjan J. C. van Gemund, Rui Abreu. Probabilistic Error Propagation Modeling in Logic Circuits. In Fourth International IEEE Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings. pages 617-623, IEEE Computer Society, 2011. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.