Device-Circuit Co-Optimization for Robust Design of FinFET-Based SRAMs

Sumeet Kumar Gupta, Kaushik Roy. Device-Circuit Co-Optimization for Robust Design of FinFET-Based SRAMs. IEEE Design & Test of Computers, 30(6):29-39, 2013. [doi]

@article{GuptaR13-2,
  title = {Device-Circuit Co-Optimization for Robust Design of FinFET-Based SRAMs},
  author = {Sumeet Kumar Gupta and Kaushik Roy},
  year = {2013},
  doi = {10.1109/MDAT.2013.2266394},
  url = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2266394},
  researchr = {https://researchr.org/publication/GuptaR13-2},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design & Test of Computers},
  volume = {30},
  number = {6},
  pages = {29-39},
}