Amit Kumar Gupta, Appa Iyer Sivakumar, Viswanath Kumar Ganesan. Look ahead batching to minimize earliness/tardiness measures in batch processes. In 2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore. pages 1101-1106, IEEE, 2004. [doi]
@inproceedings{GuptaSG04,
title = {Look ahead batching to minimize earliness/tardiness measures in batch processes},
author = {Amit Kumar Gupta and Appa Iyer Sivakumar and Viswanath Kumar Ganesan},
year = {2004},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=30961&arnumber=1438073&count=104&index=85},
researchr = {https://researchr.org/publication/GuptaSG04},
cites = {0},
citedby = {0},
pages = {1101-1106},
booktitle = {2004 IEEE Conference on Robotics, Automation and Mechatronics, RAM 2004, December 1-3, 2004, Singapore},
publisher = {IEEE},
}