Deep Metric Learning with Chance Constraints

Yeti Ziya Gürbüz, Ogul Can, A. Aydin Alatan. Deep Metric Learning with Chance Constraints. In IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2024, Waikoloa, HI, USA, January 3-8, 2024. pages 532-542, IEEE, 2024. [doi]

Abstract

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