Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor - researchr publication authors

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Sankar Gurumurthy, Shobha Vasudevan, Jacob A. Abraham. Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-9, IEEE, 2006. [doi]

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