Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab. Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 173-178, IEEE Computer Society, 2007. [doi]
Abstract is missing.