Dmitri A. Gusev. Color Gamut Characterization Via Ray Tracing for Device Profile Generation. In PICS 2003: The PICS Conference, An International Technical Conference on The Science and Systems of Digital Photography, including the Fifth International Symposium on Multispectral Color Science, May 13, 2003, Rochester, NY, USA. pages 408-412, IS&T - The Society for Imaging Science and Technology, 2003. [doi]
Abstract is missing.