Optimization objectives and models of variation for statistical gate sizing

Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown. Optimization objectives and models of variation for statistical gate sizing. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 313-316, ACM, 2005. [doi]

Authors

Matthew R. Guthaus

This author has not been identified. Look up 'Matthew R. Guthaus' in Google

Natesan Venkateswaran

This author has not been identified. Look up 'Natesan Venkateswaran' in Google

Vladimir Zolotov

This author has not been identified. Look up 'Vladimir Zolotov' in Google

Dennis Sylvester

This author has not been identified. Look up 'Dennis Sylvester' in Google

Richard B. Brown

This author has not been identified. Look up 'Richard B. Brown' in Google