Matthew R. Guthaus, Natesan Venkateswaran, Vladimir Zolotov, Dennis Sylvester, Richard B. Brown. Optimization objectives and models of variation for statistical gate sizing. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 313-316, ACM, 2005. [doi]
Abstract is missing.