1 Adaptive defect simulation flow for Defect-oriented Test evaluation

Valentin Gutierrez, Gildas Léger. 1 Adaptive defect simulation flow for Defect-oriented Test evaluation. In 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2019, Lausanne, Switzerland, July 15-18, 2019. pages 65-68, IEEE, 2019. [doi]

@inproceedings{GutierrezL19-0,
  title = {1 Adaptive defect simulation flow for Defect-oriented Test evaluation},
  author = {Valentin Gutierrez and Gildas Léger},
  year = {2019},
  doi = {10.1109/SMACD.2019.8795236},
  url = {https://doi.org/10.1109/SMACD.2019.8795236},
  researchr = {https://researchr.org/publication/GutierrezL19-0},
  cites = {0},
  citedby = {0},
  pages = {65-68},
  booktitle = {16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2019, Lausanne, Switzerland, July 15-18, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1201-5},
}