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Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors

Hipólito Guzmán-Miranda, M. A. Aguirre, Jonathan Noel Tombs. Noninvasive Fault Classification, Robustness and Recovery Time Measurement in Microprocessor-Type Architectures Subjected to Radiation-Induced Errors. IEEE T. Instrumentation and Measurement, 58(5):1514-1524, 2009. [doi]

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