Gábor Gyepes, Juraj Brenkus, Daniel Arbet, Viera Stopjaková. Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 395-396, IEEE, 2011. [doi]
Abstract is missing.