DDT test approach and its efficiency in covering resistive opens in SRAM arrays

Gábor Gyepes, Viera Stopjaková, Daniel Arbet, Libor Majer, Juraj Brenkus. DDT test approach and its efficiency in covering resistive opens in SRAM arrays. Microprocessors and Microsystems, 38(5):359-367, 2014. [doi]

Abstract

Abstract is missing.