José Pineda de Gyvez, Guido Gronthoud, Rashid Amine. VDD Ramp Testing for RF Circuits. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 651-658, IEEE Computer Society, 2003. [doi]
@inproceedings{GyvezGA03,
title = {VDD Ramp Testing for RF Circuits},
author = {José Pineda de Gyvez and Guido Gronthoud and Rashid Amine},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630651abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/GyvezGA03},
cites = {0},
citedby = {0},
pages = {651-658},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}