José Pineda de Gyvez, Guido Gronthoud, Rashid Amine. VDD Ramp Testing for RF Circuits. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 651-658, IEEE Computer Society, 2003. [doi]
Abstract is missing.