Shota Hachisuka, Yuta Nakada, Hidetsugu Nanba, Satoshi Fukuda. Japanese Patent Classification Using Few-shot Learning. In 14th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2023, Koriyama, Japan, July 8-13, 2023. pages 118-121, IEEE, 2023. [doi]
Abstract is missing.