Koutaro Hachiya, Atsushi Kurokawa. Variability Cancellation to Improve Diagnostic Performance of Testing through Silicon Vias in Power Distribution Network of 3D-IC. In 2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{HachiyaK19,
title = {Variability Cancellation to Improve Diagnostic Performance of Testing through Silicon Vias in Power Distribution Network of 3D-IC},
author = {Koutaro Hachiya and Atsushi Kurokawa},
year = {2019},
doi = {10.1109/3DIC48104.2019.9058881},
url = {https://doi.org/10.1109/3DIC48104.2019.9058881},
researchr = {https://researchr.org/publication/HachiyaK19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4870-0},
}