Thomas Hackl, Mathias Poik, Georg Schitter. DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-5, IEEE, 2022. [doi]
@inproceedings{HacklPS22, title = {DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy}, author = {Thomas Hackl and Mathias Poik and Georg Schitter}, year = {2022}, doi = {10.1109/I2MTC48687.2022.9806676}, url = {https://doi.org/10.1109/I2MTC48687.2022.9806676}, researchr = {https://researchr.org/publication/HacklPS22}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022}, publisher = {IEEE}, isbn = {978-1-6654-8360-5}, }