Thomas Hackl, Mathias Poik, Georg Schitter. DC-Bias-free Surface Potential Measurements by Heterodyne AC Kelvin Probe Force Microscopy. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2022, Ottawa, ON, Canada, May 16-19, 2022. pages 1-5, IEEE, 2022. [doi]
Abstract is missing.