Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids

Thomas Hackl, Mathias Poik, Georg Schitter. Heterodyne AC Kelvin Probe Force Microscopy for Nanoscale Surface Potential Imaging in Liquids. IEEE T. Instrumentation and Measurement, 72:1-8, 2023. [doi]

Abstract

Abstract is missing.