Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Roberts. A stand-alone integrated test core for time and frequency domain measurements. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 1031-1040, IEEE Computer Society, 2000.
@inproceedings{HafedAR00,
title = {A stand-alone integrated test core for time and frequency domain measurements},
author = {Mohamed Hafed and Nazmy Abaskharoun and Gordon W. Roberts},
year = {2000},
tags = {testing},
researchr = {https://researchr.org/publication/HafedAR00},
cites = {0},
citedby = {0},
pages = {1031-1040},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}