A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing - researchr publication authors

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Mohamed Hafed, Antonio H. Chan, Geoffrey Duerden, Bardia Pishdad, Clarence Tam, Sebastien Laberge, Gordon W. Roberts. A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 728-737, IEEE, 2004. [doi]

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