A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data

John G. Hagedorn, Holly E. Rushmeier, John Blendell, Mark Vaudin. A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data. In IEEE Visualization. pages 397-400, 1996.

Authors

John G. Hagedorn

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Holly E. Rushmeier

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John Blendell

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Mark Vaudin

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