John G. Hagedorn, Holly E. Rushmeier, John Blendell, Mark Vaudin. A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data. In IEEE Visualization. pages 397-400, 1996.
@inproceedings{HagedornRBV96,
title = {A System for Measuring Surface Facet Orientation from Atomic Force Microscope Data},
author = {John G. Hagedorn and Holly E. Rushmeier and John Blendell and Mark Vaudin},
year = {1996},
tags = {data-flow, e-science},
researchr = {https://researchr.org/publication/HagedornRBV96},
cites = {0},
citedby = {0},
pages = {397-400},
booktitle = {IEEE Visualization},
}