Amr Haggag, Nik Sumikawa, Aamer Shaukat. Reliability/yield trade-off in mitigating "no trouble found" field returns. In 21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015. pages 174-175, IEEE, 2015. [doi]
@inproceedings{HaggagSS15,
title = {Reliability/yield trade-off in mitigating "no trouble found" field returns},
author = {Amr Haggag and Nik Sumikawa and Aamer Shaukat},
year = {2015},
doi = {10.1109/IOLTS.2015.7229854},
url = {http://dx.doi.org/10.1109/IOLTS.2015.7229854},
researchr = {https://researchr.org/publication/HaggagSS15},
cites = {0},
citedby = {0},
pages = {174-175},
booktitle = {21st IEEE International On-Line Testing Symposium, IOLTS 2015, Halkidiki, Greece, July 6-8, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7905-2},
}