Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis

Shiho Hagiwara, Takanori Date, Kazuya Masu, Takashi Sato. Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis. IEICE Transactions, 97-C(4):280-288, 2014. [doi]

Abstract

Abstract is missing.