Ya Hai, Fei Liu, Yongshan Wang, Jing Kang. An all-digital built-in-self-test scheme for duty cycle corrector with de-skew circuit in NAND Flash memory. Microelectronics Journal, 141:105947, November 2023. [doi]
@article{HaiLWK23,
title = {An all-digital built-in-self-test scheme for duty cycle corrector with de-skew circuit in NAND Flash memory},
author = {Ya Hai and Fei Liu and Yongshan Wang and Jing Kang},
year = {2023},
month = {November},
doi = {10.1016/j.mejo.2023.105947},
url = {https://doi.org/10.1016/j.mejo.2023.105947},
researchr = {https://researchr.org/publication/HaiLWK23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {141},
pages = {105947},
}