Syed Waseem Haider, João W. Cangussu. Bayesian Estimation of Defects based on Defect Decay Model: BayesED:::3M:::. In Kang Zhang, George Spanoudakis, Giuseppe Visaggio, editors, Proceedings of the Eighteenth International Conference on Software Engineering & Knowledge Engineering (SEKE 2006), San Francisco, CA, USA, July 5-7, 2006. pages 256-261, 2006.
Abstract is missing.