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Texture Defect Detection

Michal Haindl, Jiri Grim, Stanislav Mikes. Texture Defect Detection. In Walter G. Kropatsch, Martin Kampel, Allan Hanbury, editors, Computer Analysis of Images and Patterns, 12th International Conference, CAIP 2007, Vienna, Austria, August 27-29, 2007, Proceedings. Volume 4673 of Lecture Notes in Computer Science, pages 987-994, Springer, 2007. [doi]

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