S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, A. Durier, Hélène Frémont. Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectronics Reliability, 76:674-679, 2017. [doi]
@article{Hairoud-Airieau17,
title = {Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach},
author = {S. Hairoud-Airieau and Geneviève Duchamp and Tristan Dubois and Jean-Yves Delétage and A. Durier and Hélène Frémont},
year = {2017},
doi = {10.1016/j.microrel.2017.07.030},
url = {https://doi.org/10.1016/j.microrel.2017.07.030},
researchr = {https://researchr.org/publication/Hairoud-Airieau17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {76},
pages = {674-679},
}