Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach

S. Hairoud-Airieau, Geneviève Duchamp, Tristan Dubois, Jean-Yves Delétage, A. Durier, Hélène Frémont. Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. Microelectronics Reliability, 76:674-679, 2017. [doi]

Abstract

Abstract is missing.