Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling - researchr publication authors

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Siham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp. Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 53-58, IEEE, 2013. [doi]

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