Abstract is missing.
- A technique for estimating signal waveforms at inaccessible points in high speed digital circuitsTomohiro Kinoshita, Shoichi Hara, Eiji Takahashi, Kazuhide Uriu. 1-4 [doi]
- Chair's welcomeOsami Wada. 1 [doi]
- Design and measurement of a compact on-interposer passive equalizer for chip-to-chip high-speed differential signalingHeegon Kim, Jonghyun Cho, Daniel H. Jung, Jonghoon J. Kim, Sumin Choi, Joungho Kim, Junho Lee, Kunwoo Park. 5-9 [doi]
- Signal integrity and EMC performance enhancement using 3D integrated circuits - A case studyEtienne Sicard, Jianfei Wu, Jiancheng Li. 10-14 [doi]
- Kron simulation of field-to-line coupling using a meshed and a modified Taylor cellSjoerd Op't Land, Richard Perdriau, Mohammed Ramdani, Olivier Maurice, M'hamed Drissi. 15-20 [doi]
- Extraction of deterministic and random LSI noise models with the printed reverberation boardUmberto Paoletti, Takashi Suga. 21-26 [doi]
- Broadband detection of radiating moments using the TEM-cell and a phase-calibrated oscilloscopeRenaud Gillon, Niko Bako, Adrijan Baric. 27-32 [doi]
- Substrate noise reduction based on impedance balance using tunable resistancesAtsushi Nakamura, Masaaki Maeda, Tohlu Matsushima, Osami Wada. 33-36 [doi]
- Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICsMakoto Nagata, Shunsuke Shimazaki, Naoya Azuma, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Satoshi Tanaka, Masahiro Yamaguchi. 37-41 [doi]
- Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulatorNaoya Azuma, Shunsuke Shimazaki, Noriyuki Miura, Makoto Nagata, Tomomitsu Kitamura, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Atsushi Nakamura, Kenta Tsukamoto, Mizuki Iwanami, Eiji Hankui, Sho Muroga, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi. 42-46 [doi]
- In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin filmSho Muroga, Y. Shimada, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi, Naoya Azuma, Makoto Nagata, Motoki Murakami, Kazuaki Hori, Satoru Takahashi. 47-52 [doi]
- Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modelingSiham Hairoud, Tristan Dubois, Angelique Tetelin, Geneviève Duchamp. 53-58 [doi]
- Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulatorTohlu Matsushima, Nobuaki Ikehara, Takashi Hisakado, Osami Wada. 59-62 [doi]
- A generalized accurate modelling method for automotive bulk current injection (BCI) test setups up to 1 GHzSergey Miropolsky, Alexander Sapadinsky, Stephan Frei. 63-68 [doi]
- IC-Stripline design optimization using response surface methodologyTvrtko Mandic, Renaud Gillon, Adrijan Baric. 69-73 [doi]
- Study of radiated immunity of an electronic system in a reverberating chamberL. Guibert, P. Millot, Xavier Ferrières, Etienne Sicard. 74-77 [doi]
- Transient analysis of EM radiation associated with information leakage from cryptographic ICsYu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yuichiro Okugawa, Yoshiharu Akiyama. 78-82 [doi]
- Noise-immune design of Schmitt trigger logic gate using DTMOS for sub-threshold circuitsKyungsoo Kim, Wansoo Nah, Soyoung Kim. 83-88 [doi]
- Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMIC. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer. 89-94 [doi]
- An optimizing technique to lower both phase noise and susceptibility of a voltage controlled oscillatorJeremy Raoult, A. Blain, Sylvie Jarrix. 95-100 [doi]
- EMC analysis of current source gate driversAlexis Schindler, Benno Koeppl, Bernhard Wicht. 101-106 [doi]
- EMI resisting LDO voltage regulator with integrated current monitorPhilipp Schroeter, Stefan Jahn, Frank Klotz, Fabio Ballarin, Fabio Gini, Marco Piselli. 107-112 [doi]
- A study on gate voltage fluctuation of MOSFET induced by switching operation of adjacent MOSFET in high voltage power conversion circuitTsuyoshi Funaki. 113-118 [doi]
- Active magnetic field canceling systemWei-Li Sun, Feng-Chang Chuang, Yu-Lin Song, Chwen Yu, Tzyh-Ghuang Ma, Tzong-Lin Wu, Luh-Maan Chang. 119-122 [doi]
- Spread spectrum clocking for emission reduction of charge pump applicationsBernd Deutschmann. 123-128 [doi]
- Evaluating the impact of substrate noise on conducted EMI in automotive microcontrollersMarco Cazzaniga, Patrice Joubert Doriol, Aurora Sanna, Emmanuel Blanc, Valentino Liberali, Davide Pandini. 129-133 [doi]
- Impedance balance control for suppression of fluctuation on ground voltage in LSI packageMasaaki Maeda, Tohlu Matsushima, Osami Wada. 134-137 [doi]
- Automatic conducted-EMI microcontroller model buildingShih-Yi Yuan, Shry-Sann Liao. 138-141 [doi]
- Evaluation of PDN impedance and power supply noise for different on-chip decoupling structuresHaruya Fujita, Hiroki Takatani, Yosuke Tanaka, Shohei Kawaguchi, Masaomi Sato, Toshio Sudo. 142-146 [doi]
- Characterization of conducted emission at high frequency under different temperatureN. Berbel, Raúl Fernández-García, Ignacio Gil. 147-151 [doi]
- Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE modelAndré Durier, Christian Marot, Olivier Crépel. 152-157 [doi]
- Design of contactless wafer-level TSV connectivity testing structure using capacitive couplingJonghoon J. Kim, Heegon Kim, Sukjin Kim, Bumhee Bae, Daniel H. Jung, Sunkyu Kong, Joungho Kim, Junho Lee, Kunwoo Park. 158-162 [doi]
- Modeling and analysis of open defect in through silicon via (TSV) channelDaniel H. Jung, Heegon Kim, Jonghoon J. Kim, Joungho Kim, Hyun-Cheol Bae, Kwang-Seong Choi. 163-166 [doi]
- The direct RF power injection method up to 18 GHz for investigating IC's susceptibilityYin-Cheng Chang, Shawn S. H. Hsu, Yen-Tang Chang, Chiu-Kuo Chen, Hsu-Chen Cheng, Da-Chiang Chang. 167-170 [doi]
- Anti-resonance peak frequency control by variable on-die capacitanceWataru Ichimura, Sho Kiyoshige, Masahiro Terasaki, Ryota Kobayashi, Genki Kubo, Hiroki Otsuka, Toshio Sudo. 171-174 [doi]
- Estimation of data-dependent power voltage variations of FPGA by equivalent circuit modeling from on-board measurementsKengo Iokibe, Yoshitaka Toyota. 175-179 [doi]
- Microcontroller emission simulation based on power consumption and clock systemThomas Steinecke. 180-185 [doi]
- A microcontrller conducted EMI model building for software-level effectShih-Yi Yuan. 186-189 [doi]
- Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emissionAlexandre Boyer, Sonia Ben Dhia. 190-195 [doi]
- System-ESD validation of a microcontroller with external RC-filterThomas Steinecke, Markus Unger, Stanislav Scheier, Stephan Frei, Josip Bacmaga, Adrijan Baric. 196-201 [doi]
- Automatic verification of EMC immunity by simulationBertrand Vrignon, P. Caunegre, John Shepherd, Jianfei Wu. 202-207 [doi]
- Electro-magnetic robustness of integrated circuits: from statement to predictionSonia Ben Dhia, Alexandre Boyer. 208-213 [doi]
- EMC immunity of integrated smart power transistors in a non-50Ω environmentHermann Nzalli, Wolfgang Wilkening, Rolf H. Jansen. 214-219 [doi]
- Discrete low-frequency transistors subjected to high-frequency CW and pulse-modulated sine signalsSylvie Jarrix, Jeremy Raoult, A. Doridant, C. Pouant, P. Hoffmann. 220-225 [doi]
- Noise analysis using on-chip waveform monitor in bandgap voltage referencesAkitaka Murata, Shuji Agatsuma, Daisaku Ikoma, Kouji Ichikawa, Takahiro Tsuda, Makoto Nagata, Kumpei Yoshikawa, Yuuki Araga, Yuji Harada. 226-231 [doi]
- Immunity evaluation of inverter chains against RF power on power delivery networkKumpei Yoshikawa, Yuji Harada, Noriyuki Miura, Noriaki Takeda, Yoshiyuki Saito, Makoto Nagata. 232-237 [doi]
- Magnetic field coupling on analog-to-digital converter from wireless power transfer system in automotive environmentBumhee Bae, Sunkyu Kong, Jonghoon J. Kim, Sukjin Kim, Joungho Kim. 238-242 [doi]
- Immunity simulation method for automotive power module using electromagnetic analysisYosuke Kondo, Kei Tsunada, Norimasa Oka, Masato Izumichi. 243-248 [doi]
- Translation of automotive module RF immunity test limits into equivalent IC test limits using S-parameter IC modelsHugo Pues, Ben Brike, Celina Gazda, Peter Teichmann, Kristof Stijnen, Christian Peeters, André Durier, Dries Vande Ginste. 249-253 [doi]