Naoya Azuma, Shunsuke Shimazaki, Noriyuki Miura, Makoto Nagata, Tomomitsu Kitamura, Satoru Takahashi, Motoki Murakami, Kazuaki Hori, Atsushi Nakamura, Kenta Tsukamoto, Mizuki Iwanami, Eiji Hankui, Sho Muroga, Yasushi Endo, Satoshi Tanaka, Masahiro Yamaguchi. Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulator. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 42-46, IEEE, 2013. [doi]
Abstract is missing.