A microcontrller conducted EMI model building for software-level effect

Shih-Yi Yuan. A microcontrller conducted EMI model building for software-level effect. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 186-189, IEEE, 2013. [doi]

Abstract

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