Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yuichiro Okugawa, Yoshiharu Akiyama. Transient analysis of EM radiation associated with information leakage from cryptographic ICs. In 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2013, Nara, Japan, December 15-18, 2013. pages 78-82, IEEE, 2013. [doi]
Abstract is missing.