MOMENT: A Cross-Layer Method to Mitigate Multiple Event Transients in Combinational Circuits

Amir M. Hajisadeghi, Hossein Bardareh, Hamid R. Zarandi. MOMENT: A Cross-Layer Method to Mitigate Multiple Event Transients in Combinational Circuits. In Martin Novotný, Nikos Konofaos, Amund Skavhaug, editors, 21st Euromicro Conference on Digital System Design, DSD 2018, Prague, Czech Republic, August 29-31, 2018. pages 237-243, IEEE Computer Society, 2018. [doi]

@inproceedings{HajisadeghiBZ18,
  title = {MOMENT: A Cross-Layer Method to Mitigate Multiple Event Transients in Combinational Circuits},
  author = {Amir M. Hajisadeghi and Hossein Bardareh and Hamid R. Zarandi},
  year = {2018},
  doi = {10.1109/DSD.2018.00052},
  url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2018.00052},
  researchr = {https://researchr.org/publication/HajisadeghiBZ18},
  cites = {0},
  citedby = {0},
  pages = {237-243},
  booktitle = {21st Euromicro Conference on Digital System Design, DSD 2018, Prague, Czech Republic, August 29-31, 2018},
  editor = {Martin Novotný and Nikos Konofaos and Amund Skavhaug},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5386-7377-5},
}