Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Ibrahim N. Hajj, Terry Lee. Simulation of physical faults in VLSI circuits. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 202-207, IEEE, 1992. [doi]
Abstract is missing.