Nagib Hakim, A. Bhaduri, K. Donepudi, S. Bodapati. A hybrid electrical-behavioral modeling approach for pre- and post-silicon electrical validation. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-5, IEEE, 2012. [doi]
@inproceedings{HakimBDB12, title = {A hybrid electrical-behavioral modeling approach for pre- and post-silicon electrical validation}, author = {Nagib Hakim and A. Bhaduri and K. Donepudi and S. Bodapati}, year = {2012}, doi = {10.1109/CICC.2012.6330559}, url = {http://dx.doi.org/10.1109/CICC.2012.6330559}, researchr = {https://researchr.org/publication/HakimBDB12}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012}, publisher = {IEEE}, isbn = {978-1-4673-1555-5}, }