Juha Häkkinen, Pekka Syri, Juha-Veikko Voutilainen, Markku Moilanen. A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 551-559, IEEE, 2004. [doi]
@inproceedings{HakkinenSVM04,
title = {A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for IEEE 1149.4},
author = {Juha Häkkinen and Pekka Syri and Juha-Veikko Voutilainen and Markku Moilanen},
year = {2004},
doi = {10.1109/ITC.2004.11},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.11},
tags = {rule-based},
researchr = {https://researchr.org/publication/HakkinenSVM04},
cites = {0},
citedby = {0},
pages = {551-559},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}