Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Geers, Olaf van der Sluis. Cohesive zone modeling for structural integrity analysis of IC interconnects. Microelectronics Reliability, 47(8):1251-1261, 2007. [doi]
Abstract is missing.