Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee. Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 665-673, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Achintya Halder' in GoogleThis author has not been identified. Look up 'Soumendu Bhattacharya' in GoogleThis author has not been identified. Look up 'Abhijit Chatterjee' in Google

runs on WebDSL