Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee. Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 665-673, IEEE Computer Society, 2003. [doi]
@inproceedings{HalderBC03,
title = {Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models},
author = {Achintya Halder and Soumendu Bhattacharya and Abhijit Chatterjee},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630665abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HalderBC03},
cites = {0},
citedby = {0},
pages = {665-673},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}